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Prism
Multimodal characterization in one automated platform

Prism accelerates materials characterization by combining photoluminescence, lifetime, transmittance, and reflectance measurements in a single automated instrument.

Load samples

Place individual or multiple samples in the sample tray.

Define routine

Select measurement modes, settings, and locations. 

Measure

Prism automatically executes the measurement routine.

Analyze & export

Review results, compare, and export your data.

HOW PRISM WORKS

Automated measurements. Actionable insights.

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Load samples

Place individual or multiple samples in the sample tray.

MNCL BT G12 - toon shading.png

Define routine

Select measurement modes, settings, and locations. 

MNCL BT G12 - toon shading.png

Measure

Prism automatically executes the measurement routine.

MNCL BT G12 - toon shading.png

Analyze & export

Review results, compare, and export your data.

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High-throughput screening of partially-fabricated perovskite devices

Explore how Prism can be used to rapidly evaluate device performance during sample fabircation.

Spectrally-resolved photoluminescence (SRPL)

Capture PL emission spectra to probe features such as bangap and non-radiative losses.

Spot sizes from 50 µm - 3 mm

Available with absolute intensity calibration

Configurable in transmission and reflection measurement geometries

Prism_SRPL.png

Hyperspectral mapping

Generate coarse or high-resolution spatial maps for all measurement modalities to probe defects, identify nonuniformities, and inspect features of interest, such as laser scribes. (example data from SRPL map of FAPbI3 perovskite film – similar maps can be collected for all measurement modes)

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MEASUREMENT CAPABILITIES

A modular characterization platform

CORE MEASUREMENT MODES
OTHER CAPABILITIES
APPLICATION SPOTLIGHT
Prism_SRPL.png

Spectrally-resolved photoluminescence (SRPL)

Capture PL emission spectra to probe features such as bangap and non-radiative losses.

Spot sizes from 50 µm - 3 mm

Available with absolute intensity calibration

Configurable in transmission and reflection measurement geometries

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AUTOMATION & SOFTWARE

Built to run itself — or run inside your loop

Automated measurement routines

Configure custom routines once; Prism handles sample positioning and data acquisition unattended.

Onboard data management

Measurements and metadata can be quickly tagged to samples and saved locally on your Prism or streamed directly into your organization's database.

Python API

Full hardware control and data access allow Prism to be dropped into self-driving labs as a standalone characterization node.

Light source

405 nm¹

Detection

350–1050 nm²

Time resolution

0.5 ns

Spot size

10–1000 µm³

Mapping resolution

25 µm⁴

Power

1x10⁻​⁻⁹ –10 mW

Repetition rate

1 Hz–40 MHz

Time-resolved PL

Transmission or reflection geometry – or both

1.

450, 488, 515, 638 nm or 3-color laser also available

2.

IR detector and motorized filter wheel also available

3.

Configurable to your specification

4.

Dependent on spot size

Light source

450–950nm¹

Detection

450–1050 nm²

Spectral resolution

1.8 nm (FWHM)³

Spot size

500–3000 µm⁴

Mapping resolution

500 µm⁵

Power

1x10⁻​⁻⁶ –1x10​⁻⁻³ mW

Transmittance & Reflectance

Select from one or both – each module shares the same detector

1.

UV-enhanced broadband source also avaialble

2.

IR detector also available

3.

Custom options range from 0.36-11.52 nm

4.

Configurable to your specification

5.

Dependent on spot size

Light source

405 nm¹

Detection

350–1050 nm²

Spectral resolution

1.8 nm (FWHM)³

Spot size

50–3000 µm⁴

Mapping resolution

25 µm⁵

Power

1x10⁻​⁻⁴ –10 mW

Spectally-resolved PL

Transmission or reflection geometry – or both

1.

450, 488, 515, or 638 nm also available

2.

IR detector also available

3.

Custom options range from 0.36-11.52 nm

4.

Configurable to your specification

5.

Dependent on spot size

1.

405, 488, 515, or 638 nm also available

2.

IR detector also available

3.

0.36-11.52 nm also avaialble

4.

Configurable to your specification

5.

Dependent on spot size

Light source

405 nm¹

Detection

350–1050 nm²

Spectral Resolution

1.8 nm (FWHM)³

Spot size

50–3000 µm⁴

Mapping resolution

25 µm⁵

Power

1x10⁻​⁻⁴ –10 mW

Spectally-Resolved PL

Transmission or reflection geometry – or both

Max scan area

210 X 210 mm    Custom options available

Power

100–240 VAC, 50/60 Hz

Weight / size

40 kg · 50 (W) × 70 (D) × 50 (H) cm    Configuration dependent

Sample trays

(2x) custom trays included   

Common formats include glass slides and silicon wafers up to G12 (210 x 210 mm)

Vacuum chucks and sample trays for flexible substrates and well plates are also available

SPECIFICATIONS

Specifications overview

GENERAL SYSTEM SPECS
MEASUREMENT MODULES — MIX & MATCH

Standard Prism

Select from our standard options to build a system that suits your research needs.

Compatible with common sample form factors

Wide range of standard options

Fastest lead-time

Custom Prism

Customize your Prism to match your specific materials and workflow.

Specialized sample handling & environmental control

Custom form factor and scanning size

New light sources and detectors

STANDARD & CUSTOM OPTIONS

Built to meet your needs

BEYOND THE BENCHTOP

Need this on your production line?

Prism's measurement modules can run at full production speed for in-line and at-line process inspections. 

Ready to see Prism in your lab?

Tell us about your materials and measurements. We'll recommend the right configuration.

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