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  • Access a complete characterization suite capable of probing a range of orthogonal material properties with a single tool.

     

    Measurement capabilities include:

    • Transmission

    • Spectrally-resolved Photoluminescence

    • Time-resolved Photoluminescence

  • Data acquisition rates on the order of 100's of milliseconds enable near real-time characterization. Quickly probe large format samples up to 210 x 210 mm (G12 wafer size) or study a batch of up to 36 1"x1" samples in seconds. 

  • Quickly configure custom measurement routines and automate the data collection process. Just load your samples, press start, and let Prism do the rest. All data is then seamlessly streamed to onboard data management software or can be integrated into your organization's existing database.

  • The optical measurements included in the Prism benchtop measurement tool are inherently non-contact and non-destructive. Probe material quality or functional layers of interest at any point during a material's fabrication process.

* Laser wavelength can be selected from 405, 450, 520, 640, 785, and 820 nm

** Values provided are based on demonstrated capabilities

Transmission

Spectrally-Resolved PL

Time-Resolved PL

Light Source Wavelength (nm)

Detection Wavelength (nm)

Time Resolution (ns)

Measurement Speed (ms)

Spot Size (μm)

Power (mW)

500-950

405*

450*

350-1000

350-1000

450-1000

5

--

--

30

100

100

10-1000

10-1000

100

0-300

0-120

0-30

Hyperspectral Mapping

Scan Area

210 x 210 mm

210 x 210 mm

210 x 210 mm

Resolution** (µm)

100

5

5

Weight / Size

40 kg / 50 cm (W) x 70 cm (D) x 41 cm (H)

Power Requirements

100-240 VAC, 50/60 Hz

TECHNICAL SPECIFICATIONS

PRODUCT

Introducing Prism

Prism is a high-throughput, multi-modal characterization tool offering multidimensional data sets previously inaccessible with existing commercial tools. Unlock a holistic view of your material's performance with less time and effort thanks to high-speed data acquisition and fully automated operation.

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